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39SF020A-70-4C-WHE

39SF020A-70-4C-WHE资料
39SF020A-70-4C-WHE
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Description:Notes:  1. VIL (min.) = C2.0V for pulse duration of 20 ns.  2. Magnetic field exposure is highly dependent on the distance from the magnetic field source. The magnetic field falls off as 1/R squared, where R is the distance   from the magnetic source.  3. Exposure beyond this level may cause loss of data.  4. IIX during access to 64 device ID and silicon signature bytes with super voltage pin at VCC + 2.0V will be 100 µA max.  5. Typical specifications are the mean values measured over a large sample size across normal production process variations and are taken at nominal conditions   (TA = 25C, VCC). Parameters are guaranteed by design and characterization, and not 100% tested.  6. Tested initially and after any design or process changes that may affect these parameters.
 
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型 号:39SF020A-70-4C-WHE
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封 装:TSOP
批 号:07+
数 量:500
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