联系人:
刘先生,罗小姐,刘小姐,刘先生,王先生
联系电话:
0086-755-83576094
83576097
83576087
83576084
83979425
点击这里给我发消息
点击这里给我发消息
点击这里给我发消息
MSN:franlmk168@live.cn 
首页 | 公司介绍 | 公司动态 | 产品展示 | 库存查询 | 技术资料 | 客户留言 | 在线订购 | 联系我们 |

NN5198K

NN5198K资料
NN5198K
PDF Download
 
File Size : 116 KB
Manufacturer:MAT
Description:Some care must be used in interpreting the numbers in this table. Philips Semiconductors feels strongly that the specifications set forth in a data sheet should reflect as accurately as possible the operation of the part in an actual system. In particular, the input threshold values of VIH and VIL can be tested by the user with parametric test equipment … if VIH and VIL are applied to the inputs, the outputs will be at the voltages guaranteed by the DC Electrical Characteristics table providing that there is adequate grounding and the input voltages are free from noise, otherwise a guardbanded VIH and VIL should be used, i.e., 2.5V instead of 2.0V and 0.5V instead of 0.8V. There is a tendency on the part of some users to use VIH and VIL as conditions applied to the inputs to test the part for functionality in a truth-table exerciser mode. This frequently causes problems because of the noise present at the test head of automated test equipment. Parametric tests, such as those used for the output levels under the VIH and VIL conditions are done fairly slowly, on the order of milliseconds, and any noise present at the inputs has settled out before the outputs are measured. (This is not the case with clocked or enabled parts and poor or moderate fixturing may induce oscillations or severe ground bounce if noise is present.) But in functionality testing, the outputs are examined much faster, before the noise on the inputs is settled out and the part has assumed its final and correct output state. Since these are unloaded outputs, having faster edge rates, this causes more noise, If the outputs are loaded, the 50pF per output pin can cause substantial ground bounce. Thus VIH and VIL should never be used in testing the functionality of any TTL part including FAST. For these types of tests input voltages of +4.5V and 0.0V should be used for the High and Low states respectively.
 
相关型号
◆ GE14811
◆ B337-20-285
◆ SCD510-53-1
◆ E19323AA
◆ 48220-20629
◆ EN29LV512-70SCP
◆ 74C922WM
◆ DS32B35-33IND
◆ AT28C64B-15JU
◆ ATMEGA16A-AU
  1PCS 100PCS 1K 10K  
价 格  
 
 
型 号:NN5198K
厂 家:MAT
封 装:
批 号:6003
数 量:200
说 明:Bid Price
 
 
运  费:
所在地:
新旧程度:
 
 
留言/订购
 
所需型号 厂家 封装 批号 数量*
 
留言
 
 
联系人/公司:
联系电话:
EMail:
验证码: * 验证码
 
 
 
 
联系我们:
联系人:刘先生,罗小姐,刘小姐,刘先生,王先生
电 话:0086-755-83576094,83576097,83576087,83576084,83979425
手 机:0086-(0)13728684091
QQ:2355773149,2355773142,61991728
MSN:franlmk168@live.cn
传 真:86-755-83576061
EMail:sales@xgf-ic.com, kupan_ic@126.com
公司地址: 深圳市龙岗区龙岗街道龙岗大道远洋新干线晶钻广场2栋B座2915房
订购须知: