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| P6KE51A资料 | |
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P6KE51A PDF Download |
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File Size : 116 KB
Manufacturer:SMK Description:In no way does this imply that the devices are noise sensitive in the final system. The use of hard Highs and Lows during functional testing is done primarily to (1) reduce the effects of the large amounts of noise typically present at the test heads of automated test equipment with cables that may at times reach several feet and (2) deal with testing parts exhibiting fast edge rates and 50pF per output pin. The situation in a system on a PC board is less severe than in a noisy production environment. |
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| 相关型号 | |
| ◆ GE14811 | |
| ◆ B337-20-285 | |
| ◆ SCD510-53-1 | |
| ◆ E19323AA | |
| ◆ 48220-20629 | |
| ◆ EN29LV512-70SCP | |
| ◆ 74C922WM | |
| ◆ DS32B35-33IND | |
| ◆ AT28C64B-15JU | |
| ◆ ATMEGA16A-AU | |
| 1PCS | 100PCS | 1K | 10K | ||
| 价 格 | |||||
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型 号：P6KE51A 厂 家：SMK 封 装： 批 号： 数 量：1082 说 明：Bid Price |
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运 费： 所在地： 新旧程度： |
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| 联系人：刘先生，罗小姐， |
| 电 话：0086-755-83576094, |
| 手 机：0086-(0)13728684091 |
| QQ：2355773149,2355773142,61991728 |
| MSN：franlmk168@live.cn |
| 传 真：86-755-83576061 |
| EMail：sales@xgf-ic.com, kupan_ic@126.com |
| 公司地址： 深圳市龙岗区龙城街道龙翔大道9009号珠江广场A2栋11F |
